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IMS Publikationen

IMS Newsletter 2 / 2020

IMS Infomappe

Luca Galatro, Carmine De Martino, Jos van ‘t Hof, Mohammed Alomari, Holger Sailer, Joachim N. Burghartz, Marco Spirito
Towards Commercially Available Quartz Calibration Substrates [Conference papers]
in 2020 95th ARFTG Microwave Measurement Conference, Los Angeles, CA, USA, (Vortrag), November 2, 2020, p. 5 (2020)
LINK

Joachim Deh, Thomas Deuble
IMS Newsletter 2/20 deutsch [Newsletter]
Institut für Mikroelektronik Stuttgart, 30. Oktober 2020, 4 Seiten, no. 26 (2020)
PDF orig.

Joachim Deh, Thomas Deuble
IMS Newsletter 2/20 english [Newsletter]
Institut für Mikroelektronik Stuttgart, 30. Oktober 2020, 4 Seiten, no. 26 (2020)
PDF orig.

Ulrike Passlack, Mourad Elsobky, Andreas Mueller, Cor Scherjon, Christine Harendt, Joachim N. Burghartz
Chip-Film Patch Sensor System with Integrated Read-out ASIC for Biomedical Applications [Conference papers]
in 2020 IEEE International Conference on Flexible and Printable Sensors and Systems, Manchester, United Kingdom, (Vortrag), October 30, 2020, p. 4 (2020)
LINK

Ulrike Passlack, Nicolai Simon, Volker Buche, Christine Harendt, Thomas Stieglitz, Joachim N. Burghartz
Investigation of Long-Term Stability of Hybrid Systems-in-Foil (HySiF) for Biomedical Applications [Conference papers]
in 2020 IEEE 8th Electronics System-Integration Technology Conference, Tønsberg, Vestfold, Norway, (Vortrag), October 23, 2020, p. 6 (2020)
LINK

Christine Harendt, Martin Zimmermann
Aus einer Hand von der Idee bis zum Produkt [Broschüre / Flyer]
Institut für Mikroelektronik Stuttgart, 1. Oktober 2020, 2 Seiten (2020)
PDF orig.

Christine Harendt, Martin Zimmermann
One source from idea to product [Brochure / Flyers]
Institut für Mikroelektronik Stuttgart, October 1, 2020, p. 2 (2020)
PDF orig.

Mourad Elsobky, Thomas Deuble, Saleh Ferwana, Björn Albrecht, Christine Harendt, Alessandro Ottaviani, Mohammed Alomari, Joachim N. Burghartz
Characterization of On-Foil Sensors and Ultra-Thin Chips for HySiF Integration [Papers of journals (review)]
IEEE Sensors Journal, vol. 20, no. 14, pp. 7595-7604, July 15, 2020, DOI: 10.1109/JSEN.2020.2978550 (2020)
LINK

Martin Zimmermann, Jörg Butschke, Mathias Irmscher, Wolfgang Appel, Christine Harendt, uvm.
Einzelprozesse IMS-Technologie 2020 [Broschüre / Flyer]
Institut für Mikroelektronik Stuttgart, 1. Juli 2020, 15 Seiten (2020)
PDF orig.

Martin Zimmermann, Jörg Butschke, Mathias Irmscher, Wolfgang Appel, Christine Harendt, uvm.
Individual technology processes 2020 [Brochure / Flyers]
Institut für Mikroelektronik Stuttgart, July 1, 2020, p. 15 (2020)
PDF orig.